Floor SEM
A floor model scanning electron microscope (SEM) is a large, standing analytical instrument that uses a focused beam of high-energy electrons to image the surface of solid specimens. It provides extremely high-resolution, three-dimensional topographical imaging and chemical analysis across a wide range of magnification levels.
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Product Overview
Scanning Electron Microscope (SEM) Axia ChemiSEM
The Axia ChemiSEM is unlike traditional SEMs in that it always collects EDS data in the background. It uses unique algorithms to process the SEM and EDS signals simultaneously, allowing it to display the morphology and quantitative elemental make up of a sample together, in real time.
Scanning Electron Microscope (SEM) Prisma E SEM
The most complete SEM for multi-use laboratories requiring all-round performance and ease-of-use. Prisma E offers all-round performance in imaging and analytics, a unique environmental mode (ESEM), and a full range of accessories that make it the most complete tungsten SEM available.
Field Emission Scanning Electron Microscope (FESEM) Quattro SEM High Performance
The Thermo Scientific Quattro SEM combines all-round performance in imaging and analytics with a unique environmental mode (ESEM) that allows samples to be studied in their natural state. The field emission gun (FEG) inside the Thermo Scientific™ Quattro SEM ensures excellent resolution.
Field Emission Scanning Electron Microscope (FESEM) Apreo2 SEM
Thermo Scientific Apreo 2 SEM, a highperformance field emission gun (FEG) SEM with unique, live elemental imaging and an advanced, automated optics system that enables you to focus on your research rather than microscope performance. The Thermo Scientific™ Apreo™ SEM has earned a reputation for its versatility and high-quality imaging performance— even on magnetic or other traditionally difficult samples.
Focused Ion Beam Scanning Electron Microscopes (FIB - SEM) Scios 2 DualBeam
The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding TEM sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. With innovative features designed to increase throughput, precision, and ease of use.
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Send Inquiry Back to ProductsProduct Information
- Category Chemical Composition, Material, Microscopy
- Brand Thermo Scientific
- Status Available
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