The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. Incorporating Bruker’s proprietary tip/tilt optical head, the system is fully programmable to measure surface features over a range of angles while minimizing tracking errors. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing models in a much smaller footprint. Utilizing the industry’s most-advanced user interface, ContourX-500 provides intuitive access to an extensive library of pre-programmed filters and analyses. Along with its new USI universal scanning mode, the profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.

Most Advanced Benchtop Design for Unmatched 3D Metrology

Industry-best Z resolution independent of magnification, Advanced automation configured with encoded XY stage, auto tip/tilt head, and auto intensity, Integrated air isolation in a space-efficient footprint.

Superior Measurement and Analysis

Easy-to-use interface for quick and accurate results, Wide range of automation features to tailor measurement and analysis routines Most extensive library of filters and analysis options, Customized analysis reporting to industry standards, such as ISO 25178, ASME B46.1, ISO 4287