JPK NanoWizard

The JPK NanoWizard V combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters opens new possibilities for long-term, self-regulating experiment series.

Dimension Icon

Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.

Dimension Edge PSS

zBruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Edge PSS incorporates the incredible value and resolution for which the Dimension AFM systems are renowned, while also providing a production-based solution for substrate measurements.